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| Home > Astronomy > Detectors > EEV12 |
EEV12 Parameters with UltraDAS + SDSU Gen.2
Device Identification
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| Chip name | EEV12 |
| Year of manufacture | 1998 |
| Serial number | A5500-5 |
| First light on La Palma | May 1998 |
| Description | EEV-4280 thinned and AR coated, converted to run with UltraDAS January 2001. |
Operational Characteristics
| Speed | Slow | Fast |
| Bias (ADU) | 1244 | 810 |
| Gain (e/ADU) | 1.16 | 2.3 |
| Noise (e) | 3.5 | 6.0 |
| Noise (ADU) | 3.0 | 2.6 |
| Linear to (ADU)
{see graphs below} |
63K | 63K |
| Readout time (s) | 59 | 42 |
Windowing is available.
Linearity
Linearity was measured by R.Hijmering on the 7th January 2002 using
this method
| Vertical CTE | >0.999998 |
| Horizontal CTE | >0.999998 |
Physical Characteristics
| Pixel Scale (isis blue) | 0.19 arcsecs/pixel |
| X Pixel size | 13.5 microns |
| Y Pixel size | 13.5 microns |
| X size in pixels of digitised area | 2148 |
| Y size in pixels of digitised area | 4200 |
| X size of useful imaging area | 2048 |
| Y size of useful imaging area | 4100 |
| X start of useful imaging area | 51 |
| Y start of useful imaging area | 1 |
| LN2 capacity of cryostat | 2.5 litres |
| Cryostat window thickness | 4 mm |
| Distance from window to CCD | 10.0mm measured optically |
| Cryostat window size | 36 x 66 mm |
Operational Parameters
| Operating temperature | 158K |
| Preferred amplifier | R ( L has an HCTE problem at high readout speeds ) |
Measured Characteristics
Quantum Efficiency
Full QE curve for EEV4280 in tabulated form,
measured at ATC March 99.
Dark current
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| Full well bloom limit | 240000 electrons |
| Chip flatness | A one dimensional scan down the central column for the CCD showed a 2 micron bow |
| Cosmetics | See Dark frame |
| Cosmic Ray count | ~2000 events/chip/hour at sea level |
| Fringing | See graph of fringe amplitude vs wavelength for EEV12 |
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