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Home > Astronomy > Detectors > EEV12 |
Warning : these figures refer to EEV12 when it was used with a Dutch controller and are for reference only. EEV12 Parameters
Device Identification
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Chip name | EEV12 |
Year of manufacture | 1998 |
Serial number | A5500-5 |
First light on La Palma | May 1998 |
Description | EEV-4280 thinned and AR coated |
Speed |
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Linearity |
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Bias (ADU) |
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Gain (e/ADU) |
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Noise (e) |
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Readout time (s) |
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Vertical CTE | >0.999998 |
Horizontal CTE | >0.999998 |
Pixel Scale (isis blue) | 0.19 arcsecs/pixel |
X Pixel size | 13.5 microns |
Y Pixel size | 13.5 microns |
X size in pixels of digitised area | 2148 |
Y size in pixels of digitised area | 4200 |
X size of useful imaging area | 2048 |
Y size of useful imaging area | 4100 |
X start of useful imaging area | 50 |
Y start of useful imaging area | 0 |
LN2 capacity of cryostat | 2.5 litres |
Cryostat window thickness | 4 mm |
Distance from window to CCD | 7.29mm (10.0mm measured optically ) |
Cryostat window size | 36 x 66 mm |
Operating temperature | 153K |
Preferred amplifier | L ( R provides the same performance ) |
Quantum Efficiency
Full QE curve for EEV4280 in tabulated form,
measured at ATC March 99.
Dark current
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Full well bloom limit | 240000 electrons |
Chip flatness | A one dimensional scan down the central column for the CCD showed a 2 micron bow |
Cosmetics | |
Cosmic Ray count | ~2000 events/chip/hour at sea-level |
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