The layout of the spectrograph is shown schematically in Figure
. The slit
S is at the focal plane of the telescope. The light from the slit image (beam
a) is collimated (beam b) by an off-axis parabolic mirror C, and traverses the
three cross-dispersing quartz prisms P1, P2 and P3 before beam c is incident on
the echelle grating E. The axes of
beams a, b and c are horizontal. The light is dispersed in the vertical plane
(beam d) by the echelle grating (beam d) and is finally re-imaged by the
camera.

[ TIFF ]
Figure: Schematic
of the Utrecht Echelle Spectrograph (UES).
The main components are as follows:
(1
arcsec = 225
m)
. The slit has a maximum length of
5 arcmin; a dekker of continuously variable width is used to define the slit
length. The slit width can be set to between 0.09 and 90 arcsec. The entire slit
assembly can be rotated from -12 to +11 degrees relative to the nominal
position; this is required to ensure that the slit image is perpendicular to the
direction of dispersion (along the spectral orders). A shutter is mounted at the
rear of the slit. The slit jaws are polished so that they can be viewed with the
acquisition TV or by the autoguider.
408 mm and
nominal blaze angle of 63.4 degrees. One echelle grating has a ruling of 31.6
grooves/mm, while the other has 79 grooves/mm. The spectral
formats produced by the two echelle gratings are detailed
in Tables
and
.
Both echelles provide the same linear dispersion at the detector, and therefore the same resolving power for a given slit width. However, the free spectral range of the former is 2.5 times shorter than that of the latter; consequently, the spectral orders are 2.5 times closer together with 31.6 than with the 79 grooves/mm echelle grating. Thus, the 31.6 ruling is the preferred choice when continuous wavelength coverage of the echelle orders is the overriding consideration, while the 79 is the grating most often used for observations requiring accurate registration and subtraction of the sky signal along the slit (the maximum slit length which can be accommodated with the 79 grooves/mm echelle is 2.5 times greater than with the 31.6).
mm, the longer dimension being along the echelle orders.
) can be mounted on UES. The most commonly used detector is one of the thinned
Tektronix chips, which has a high
efficiency over a broad range of wavelengths. For observations of faint objects
the IPCS is the detector of choice, because of its extremely low dark count and
lack of read-out noise. Note that of the detectors currently available, only the
IPCS, with its 10 micron pixels, can sample the full resolving power of UES.
Table: Spectral Format of the 31.6 grooves/mm Echelle Grating
--- Sample Orders
Table: Spectral Format of the 79 grooves/mm Echelle Grating ---
Sample Orders