EEV4280
EEV4280 Quantum Efficiency data obtained in diode mode, ATC March 99 by
Simon Tulloch (ING)
nm |
+20C |
-120C
|
340
|
59.14421
|
4.91E+01
|
350
|
60.73691
|
5.07E+01
|
360
|
61.89309
|
5.31E+01
|
370
|
63.70925
|
5.74E+01
|
380
|
69.96012
|
6.50E+01
|
390
|
75.51959
|
7.14E+01
|
400
|
79.22732
|
7.60E+01
|
420
|
82.70044
|
8.00E+01
|
440
|
83.93972
|
8.16E+01
|
460
|
84.1327
|
8.23E+01
|
480
|
83.79104
|
8.22E+01
|
500
|
83.23615
|
8.19E+01
|
520
|
82.48051
|
8.14E+01
|
540
|
81.8428
|
8.09E+01
|
560
|
81.11895
|
8.04E+0
|
580
|
80.29645
|
7.95E+01
|
600
|
79.50192
|
7.85E+01
|
620
|
78.69764
|
7.73E+01
|
640
|
77.90238
|
7.60E+01
|
660
|
76.93177
|
7.42E+01
|
680
|
75.69349
|
7.20E+01
|
700
|
74.25721
|
6.95E+01
|
720
|
72.55275
|
6.68E+01
|
740
|
70.6483
|
6.40E+01
|
760
|
68.2483
|
6.03E+01
|
780
|
65.43616
|
5.64E+01
|
800
|
61.59652
|
5.13E+01
|
820
|
57.44285
|
4.62E+01
|
840
|
52.71875
|
4.09E+01
|
860
|
48.16239
|
3.59E+01
|
880
|
42.84361
|
3.04E+01
|
900
|
37.81072
|
2.56E+01
|
920
|
32.26537
|
2.05E+01
|
940
|
27.02478
|
1.60E+01
|
960
|
22.18833
|
1.20E+01
|
980
|
17.15273
|
8.18E+00
|
1000
|
12.87508
|
5.14E+00
|
1010
|
10.77495
|
3.77E+00
|
1020
|
8.699594
|
2.60E+00
|
1030
|
6.828517
|
1.68E+00
|
|