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Contents

• LDSS Users' Manual
• Contents
  • The LDSS-2 Instrument
    • Overview
    • Aperture Masks
    • Grisms and Filters
    • Performance of LDSS-2
  • LEXT
    • Startup and basic concepts
    • Preparation of mask data
      • Creating the input catalogue
      • Generating relative astrometry from LDSS-2 images
      • Designing the masks
    • How to get the masks made
      • Observatory mask manufacture facility
      • Alternative methods
  • Control systems
    • Overview
    • ICL and LDSS-2 start-up
    • Data acquisition
    • Acquisition and Guidance unit
  • Setting up the Instrument
    • Checklist
    • Detector
    • Aperture masks
    • Filters
    • Grisms
    • Rotation, tilt and focus
      • Rotation
      • Hartmann tests
      • Tilt
      • Focus
    • The optical centre of LDSS
    • Distortion
    • Positional calibration of masks
  • Observing procedure
    • At the start of the night
    • Direct imaging
    • Target acquisition with a multiaperture mask
      • Standard technique
      • Further refinements to acquisition
    • Target acquisition with a longslit
    • Calibration exposures
      • Flatfielding
      • Wavelength calibration
      • Flux calibration
  • Reducing your data
    • Distortion correction
      • Effects of distortions
      • Distortion mapping.
    • Flatfielding
    • Wavelength calibration
    • Flux calibration
    • Spectrum extraction
• LEXT manual
  • Introduction
  • Description of the user interface
    • LEXT procedures
    • Access to the operating system
    • On-line HELP.
    • Ending a LEXT session
  • The internal data stack
    • Lists
    • Images
    • Creating lists and images internally
    • Mode of operation
    • Manipulating the data stack
    • Slot status
    • Slot protection
    • Startup file
  • Internal parameters and header information
    • Examining and saving parameter settings
    • Interface options
    • Instrumental parameters
    • Mask parameters
    • Plotter parameters
    • Telescope parameters
  • Data import and export
    • Object catalogues
      • Coordinate entries
      • Keyword entries
  • Mask manufacturing tools
  • Target acquisition tools
  • Mapping focal plane to detector coordinates
  • Data processing
    • Simple Image processing
    • Simple List processing.
    • Examination and manipulation of data
    • More sophisticated image processing
  • Graphical output
    • Image display devices
    • Displaying images
    • Plotting List information
    • Defining a region of interest
    • Interactive examination of data
  • Spectrum extraction and calibration
    • Flatfielding
    • Arc subpackage
      • ARC command interface
    • Using the Extract command
• Dictionary of LEXT commands
• Standard types of List
• Procedure FIND_TWEAK
• Summary of main LEXT internal parameters
• Catalogue format
  • Coordinate entries
  • Keyword entries
  • Positional accuracy.
  • Example
• Wavelength maps
• Filter throughput

• The LDSS-2 Instrument
  • Overview
  • Aperture Masks
  • Grisms and Filters
  • Performance of LDSS-2
• LEXT
  • Startup and basic concepts
  • Preparation of mask data
    • Creating the input catalogue
    • Generating relative astrometry from LDSS-2 images
    • Designing the masks
  • How to get the masks made
    • Observatory mask manufacture facility
    • Alternative methods
• Control systems
  • Overview
  • ICL and LDSS-2 start-up
  • Data acquisition
  • Acquisition and Guidance unit
• Setting up the Instrument
  • Checklist
  • Detector
  • Aperture masks
  • Filters
  • Grisms
  • Rotation, tilt and focus
    • Rotation
    • Hartmann tests
    • Tilt
    • Focus
  • The optical centre of LDSS
  • Distortion
  • Positional calibration of masks
• Observing procedure
  • At the start of the night
  • Direct imaging
  • Target acquisition with a multiaperture mask
    • Standard technique
    • Further refinements to acquisition
  • Target acquisition with a longslit
  • Calibration exposures
    • Flatfielding
    • Wavelength calibration
    • Flux calibration
• Reducing your data
  • Distortion correction
    • Effects of distortions
    • Distortion mapping.
  • Flatfielding
  • Wavelength calibration
  • Flux calibration
  • Spectrum extraction