The TEK5 CCD for use on IDS


Characteristics of the TEK5 CCD on IDS

  1. General information on the device
  2. Vital statistics - gains, readout noise, etc
  3. Spectral resolutions and wavelength coverage
  4. Spatial scale on IDS
  5. Fringing and Cosmetic defects
  6. Linearity measurements
  7. Flux standard data and empirical through-puts
  8. Quality control history of TEK5

1. General information on the device

This is a typical 1kx1k TEK CCD (with 24 micron pixels), and details of it's commissioning history can be found on the ING detectors information pages. , It has three overscan regions covering the areas [1:50,1:1124] plus [1075:1124,1:1124] and also [1:1124,1025:1124] ; where these coordinates are in the form [xstart:xend,ystart:yend].

2. Vital statistics - gains, readout noise, etc

In the following tables the values for gain are given in e-/ADU, the read-out noise in e-, and the read-out time is in seconds for a windowed chip which covers the full IDS slit length (columns 320-640 approximately).
TEK5

Unbinned
Binned 1x2 (spectrally)
Binned 2x1 (spatially)
Binned 2x2 (both)
Speed gain (e-/adu) Noise (e-) Time (s)
gain Noise Time
gain Noise Time
gain Noise Time
STANDARD 1.18 4.4 30
1.2 4.5 15
1.2 4.5 15
1.2 4.5 15
QUICK 1.60
 5.2
 28
TURBO 2.50
 7.30
 20
There is only one read-out speed usable when on-chip binning is used, this effectively has standard read-out speed characteristics.

3. Spectral resolutions and wavelength coverage

The table linked here gives the dispersion provided by each grating when mounted on the 235mm and the 500mm cameras. Observers can calculate the dispersion provided, given that the pixel size is 24 microns. Since the two cameras have different magnifications, and hence different slit-width specfications for a particaular required resolution, and since we also have the EEV10 available for the IDS (with 13.5 micron pixels) , Observers should think carefully about what is the best option for their programs and should contact Stephen Smartt sjst@ing.iac.es if they need any advice regarding the most effiecient use of IDS and the EEV/TEK detector choice.

5. Fringing and Cosmetic defects

The TEK chips suffer from fringing in the red part if the spectrum, but the effect is considerably less severe than the EEV42-80s. Some illustrative flat field spectra will be linked from here soon, but in the meantime the following numbers should serve as a reference guide to the severity of the problem : 
 
Wavelength     Peak-to-Peak Amplitude
6500Å                 0%
7000Å                 0%
7500Å                 2%
8000Å                 5%   
8500Å                 10%
9000Å                 15%
There are a few cosmetic defects on the surface of the chip, but nothing particularly severe. A flat field image plus bias image will be visible from here shortly.

6. Linearity measurements

A linearity tests during commissioning of TEK5 showed it was linear across the range 0 - 60000 adu to better than 1%. Up-date checks on this will appear here soon.

8. Flux standard data and empirical through-puts

9. Quality control history of TEK5

Coming soon .....!
This page last updated: 21 Sept. 1998

Stephen Smartt (IDS Instrument Specialist) sjst@ing.iac.es